Feature | Description |
|---|---|
| X-Y SCAN RANGE, Z RANGE | 90μm x 90μm, 10μm in imaging and force curve modes, 9.5μm minVertical |
| VERTICAL NOISE FLOOR, XY POSITION NOISE | <30pm RMS imaging BW (625Hz), 0.15nm RMS imaging BW (625Hz) in closed-loop;0.10nm RMS imaging BW (625Hz) in open-loop |
| MAX IMAGE PIXEL SIZE | 5120 x 5120 |
| AVAILABLE MODES | Conductive AFM Option (C-AFM), Contact Mode Electrostatic Force Microscopy (EFM), Force Modulation Microscopy (FMM), Force Volume Force-Distance Measurements, HarmoniX Imaging Mode, Lateral Force Microscopy (LFM), Magnetic Force Microscopy (MFM), Nanoindenting/Scratching, PhaseImaging™ ,Scanning Capacitance Microscopy (SCM), Scanning Tunneling Microscopy (STM), Torsion Resonance Mode (TRmode) Torsional Resonance, Tunneling AFM (TR TUNA), Tunneling AFM (TUNA) |